The quality of the radiation is often referred to in material processing and measurement technology. Depending on the application, the quality is determined by the temporal and local stability of the output power, the width of the frequency spectrum, the temporal and local coherence, and the magnitude of the beam divergence, which is related to the extent to which the radiation can be focused.
This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
By means of the described UV converter optics the measurement of the intensity distribution of UV laser radiation with standard Si-based CCD or CMOS cameras is possible.
IR converter optics for Beam Profiler for measuring intensity distribution in the NIR range between 1480 and 1600 nm.
The scanning system BeamR with rotating slots for the measurement of lasers with diameters of 0.5 microns to about 3 mm
This adapter plate is also available for the Beam Profiler BeamMap and BeamR 1st generation.
Based on the patented multi plane scanning technology the scanning system the BeamMap allows the measurement of focal position, beam diameter (according to ISO 11146), divergence and the M2 factor of different focussed cw or qcw laser beams in real time.
Laser beam profiler for large laser beams up to 25 mm x 25 mm.